Potential Induced Degradation (PID) Resistance

Seraphim modules show outstanding performance inTÜV SÜD PID tests under different temperature and humidity conditions

Over its years of operation, the system voltage of a PV power generation system will cause power output of crystalline silicon cell modules to degrade. Crystalline silicon cell modules manufactured based on screen printing, with the help of encapsulation materials (EVA or glass), produce a circuit along the module frame, causing current to diverge. This explanation is considered the main cause of PID. In extreme cases, this issue causes module power to degrade by more than 50%, affecting power output of the entire power plant.
Humidity is a main cause of PID, so Seraphim focuses on its encapsulation technique and quality backsheet and EVA material selection in order to reduce the rate of moisture vapor transmission. By selecting quality raw materials and optimizing processes, the content of acetic acid in EVA is decreased, which helps to minimize PID.
Seraphim has undergone rigorous testing withTÜV SÜD to provide third party verification that Seraphim products are really PID-free. TÜV SÜD exposed Seraphim monocrystalline and polycrystalline series modules to 85% humidity, 85°C and 1000V bias voltage for 96 hours. After the test, the modules had less than 0.5% power output degradation, which far exceeds the stipulated 5% degradation. The test shows that Seraphim modules have excellent quality and performance.
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